EPRI Solutions has unparalleled experience in solving
power quality related problems across all industry sectors.
We have tested over hundreds of semiconductor
tools, dozens of subsystems and hundreds of electrical devices to the SEMI F47 standard. In the mid 1990s we developed portable voltage sag testing equipment and began
a new kind of field power quality testing. 1996, we began voltage sag testing of semiconductor tools as part of an EPRI System Compatibility Research Project.
Funded by Electric Utilities, the research project
was completed in January 1999. Our work provided essential test data to a SEMI standards task force during the development of the SEMI F47 standard.
During this time we advised the task force concerning reasonable expectations for tool immunity. Furthermore, we wrote the original draft and participated through the
final revisions of SEMI F42, which defines the test method semiconductor tool for voltage sag immunity.
Since the original testing through the EPRI Electric Utility project, we have also worked directly with semiconductor manufacturers, tool suppliers, and component suppliers
to characterize their equipment. Our test experience is broad, having evaluated tools with wafers ranging from 100mm to 300mm in size.
We have tested many if not most types of
semiconductor tools, subsystems, and components as well. Because of our experienced team of SEMI F47 Compliance Engineers and Specialists, we can test, diagnose, and
solve your power quality issues. Regardless of your industry, our mission is to lead your company to improve power quality performance.