This article describes the certification testing of Schneider Toshiba drives. Tests were done on 208Vac and 480Vac units. Checkout out the results to learn more. 

This article is about a large certification effort with Siemens related to their SIRIUS series relays and contactors. See Details..

The topic of voltage sag immunity testing methods are explored in a paper we presented at both the CIRED conference in Turin, Italy and at the EPRI PQA Conference in Vancouver, BC. In order to aid in the understanding of this important topic, we are providing a multimedia version of the power point presentation.

• For Windows Media Viewer Format Click here.
• For Real Player Format Click here.
  
  Read CIRED Paper .....

An article about Chuck Thomas' work in the rural areas of the U.S. solving power quality issues. Read about his work..

We have certified many power supplies, relays, and contactors, to standards such as SEMI F47. However, only a few drives have been certified. It is our pleasure to share the test results from our recent work with Rockwell Automation. We invite you to read more about the test and the capabilities of the PowerFlex 70 and 700 drives to meet SEMI F47 and IEC 61000-4-34.  Read more...

SEMI F47 and the SEMI F42 companion test protocol were developed using the test methodologies developed based on EPRI research from the early 1990s through 1999. The method we initially developed leads to a realistic evaluation of the equipment under test in the electrical environment and promotes compatibility with the electrical system. Since the implementation of the SEMI F47 standard, some have conducted the tests in a different manner than we originally intended in the SEMI F42 specification. Furthermore, a new IEC standard is being proposed that may not lead to level of equipment compatibility that one would expect. If you want to learn more, read the new technical paper we have co-written with a leading industry expert.  ....Read More...

Did SEMI F47 really improve the uptime of semiconductor tools? Was the effort worth it? Is the standard reaping dividends and lowering the cost of tool ownership? EPRI utility sponsors funded a study to determine the impact of SEMI F47. EPRI has released a version of the report for public consumption. Click here to download

Want to learn how to economically design semiconductor systems to be more robust to voltage sags? Join EPRI,SRP, and other industry professionals in this important workshop. Find Out More....

This article describes our work at SEMICON China 2004 where we began the process of engaging the Chinese semiconductor industry concerning SEMI F47. Read Our Review of the event.

Our most experienced SEMI F47 field testing team reflects on three years of close knit teamwork, the secret of their success, lessons learned, and memorable moments along the way.  more..

EPRI rolls out a new design of Porto-Sag, an all-in-one unit in a 100- or 200-Amp package, compact but big enough to use on large semiconductor tools and process equipment. This all-in-one design takes up less fab floor space and allows for quicker setup and take down, reducing the down time required to test.   more..

Over two years after the SEMI F47 standard was published, and many compliance tests later, some tool suppliers have made significant efforts to improve voltage sag immunity and achieve compliance while others still lag behind. EPRI has recently Written a paper that focuses on the success rates for achieving certification and outlines effective strategies to aid equipment suppliers in meeting the SEMI F47 standard. EPRI is happy to share the paper with industry to promote a better understanding of SEMI F47 compliance success rates and issues.  download paper..

A recent achievement of the EPRI Semiconductor and Industrial PQ Group involves two "marks." The Group surpassed the half-century mark, having tested 51 semiconductor tools since 1997, when the Group began testing the tools as part of an EPRI research project. The second mark is the man responsible for leading the Group toward that achievement, EPRI engineer Mark Stephens.

In January, Stephens' group of engineers and technicians tested its 51^st semiconductor tool against the SEMI F47 Standard. "We've certified over 120 tools and tool components for the semiconductor industry, both in the U.S. and in Europe."

Additionally, the Group has conducted audits for dozens of semiconductor manufacturers, most recently in Texas, Taiwan, the Philippines, and Singapore. "We have made recommendations for improving the power quality performance of over 130 tools," Stephens said, adding that many of these recommendations solved costly power quality problems.

For more information on tools tested, work experience, and qualifications click here.